Olympus STM7 - Measuring Microscopes
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Olympus STM7 Measuring Microscopes

Whether samples are small or large, simple or complex, or measurements are being taken by a novice or an expert, the Olympus STM7 range features measuring microscopes tailored to fit your needs.

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A Microscope that Measures Up to Individual Needs

Whether samples are small or large, simple or complex, or measurements are being taken by a novice or an expert, the Olympus STM7 range features measuring microscopes tailored to fit your needs.

STM7

 

Refined Optical Performance

The STM7 series uses the same UIS2 infinity-corrected optical system found in state-of-the-art optical microscopes.
As a result, observed images have high resolution and high contrast, with aberration thoroughly eliminated to help ensure highly accurate measurement in minute detail.

 

Reliable Measurements with a Stone Stage-Mounting Plate

To further improve measurement accuracy, the STM7 series uses a highly durable, vibration-resistant frame with a granite surface plate. This stability enables sub-micron level measurements with minimal error.

STM7-LF FEM analysis

STM7-LF FEM analysis

 

User-Friendly, High-Precision, 3-Axis Measurement

As modern manufacturing technology becomes increasingly miniaturized and precise, highly accurate measurements are even more essential—not only along the XY axis, but also along the Z-axis. Olympus responded by creating the first reflective active, confocal autofocus system.

3轴测量

 

Reliable Modular Systems

Five configurations provide you with flexibility to choose the features that you need.

Manual Models Motorized Models

STM7-SF

STM7-SF

STM7-MF

STM7-MF

STM7-LF

STM7-LF

STM7-MFA

STM7-MFA

STM7-LFA

STM7-LFA

STM7-CS100
Stage:100 mm x 100 mm
STM7-CS200
Stage:200 mm x 200 mm
STM7-CS300
Stage:300 mm x 300 mm
STM7-CS200
Stage:200 mm x 200 mm
STM7-CS300
Stage:300 mm x 300 mm
STM7-CS100 STM7-CS200 STM7-CS300 STM7-CS200 STM7-CS300

 

 

STM7-SF STM7-MF STM7-LF STM7-MFA STM7-LFA
Z-axis focus Manual Manual Motorized
Standard BF or BF/DF BF or BF/DF BF or BF/DF
Option DIC/POL DIC/POL DIC/POL
Measurement objectives
Brightfield
Option Option Option
Focus navigator
STM7-FN
Option Option Option
Autofocus unit
STM7-AF
Option
Measurement support software
STM7-BSW
Option Option Option

Measurement support software
(Multiple Image Alignment /MIA

and extend Focus Image/EFI)
STM7-ASW-ME

Option Option Option

OBSERVATION METHOD

BF:  Brightfield
DF:  Darkfield
DIC:  Differential interference contrast
POL:  Polarized light

Option:  Option

 

Stages that Fit Your Samples

Common Problems

  • Short measurement stroke precludes the measurement of larger samples•Samples must be rotated because the X-axis measurement area is shorter than the Y-axis measurement area
  • Due to the narrow measurement range, it is impossible to line up large numbers of samples on the stage to measure them at the same time

 

STM7 Solutions

  • The STM7 features a 300 mm x 300 mm stage capable of measuring large samples, including 300 mm wafers and printed circuit boards.
  • The X- and Y-axis measurement areas are equally long, eliminating the need to rotate samples
  • Long measurement areas for both the X and Y-axis allow multiple samples to be lined up on the stage for more efficient measurement

Maximum Measurement Stroke 300 mm x 300 mm

Three stages are available, each with a different measurement stroke - 100 mm x 100 mm, 200 mm x 200 mm, and 300 mm x 300 mm. Whether your samples are large or small, we offer a stage that fits your application.

STM7-CS100

STM7-CS100
100 mm x 100 mm

STM7-CS200

STM7-CS200
200 mm x 200 mm

STM7-CS300

STM7-CS300
300 mm x 300 mm

 

Broad Range of Magnifications and Working Distances

Common Problems

  • Most conventional measuring microscopes only accept a measuring objective or metallurgical objective, limiting the observation options

STM7 Solutions

  • The STM7 meets the requirements of a wide variety of observations. It responds to your needs at both low and high magnifications, enables the measurement of uneven samples requiring ultra-long working distance objectives, and even offers a variety of observation methods

Measuring Objectives

The objectives’ very long working distance helps you be confident when focusing on samples with large peaks and troughs and minimizes the chance that the objective comes in contact with the sample.

Furthermore, their low-magnification capability enables wide areas to be observed in a single view.

Measuring Objectives 

 

Metallurgical Objectives

Metallurgical objectives enable high-magnification, high resolution observation comparable to that of optical microscopes.

What’s more, these objectives can be used for brightfield, darkfield, and DIC observation.

Brightfield image Darkfield image

Brightfield image                                            Darkfield image

 

Revolutionary Control Unit Refines Usability

Common Problems

  • Additional functions require additional operational units. Operators can’t always locate the corresponding unit quickly, which significantly reduces measurement efficiency
  • Numerous operational units and their power supplies around the main unit occupy valuable working space

STM7 Solutions

  • Almost all measuring microscope operations can be efficiently completed on the nearest operational unit
  • The system requires only a single operational unit and power supply, regardless of how many functions are added, freeing up workspace

Controllers

With the STM7 series, a single controller makes it possible to perform virtually all measuring microscope operations, including use of readout reset, illumination control, focusing, and autofocus. For efficiency and convenience, the unit can be placed wherever you wish and operated easily with one han