Olympus BX53M Material Science Microscope

Advanced Microscopy Simplified

Designed with modularity in mind, the BX3M series provide versatility for a wide variety of materials science and industrial applications. With improved integration with PRECiV software, the BX53M provides a seamless workflow for standard microscopy and digital imaging users from observation to report creation.

BX53M

Choose the Best Model

Six BX53M suggested configuration provide you with flexibility to choose the features that you need.

For General use: Entry, Standard, Advanced
For Dedicated use: Fluorescence, Infrared, Polarization
Various configurations to meet users' requirements
Modular Design, Build Your System Your Way

Six BX53M suggested configuration

Comfortable and Easy to Use

The BX53M simplifies complex microscopy tasks through its well-designed and easy-to-use controls. Users can get the most out of the microscope without the need for extensive training. The easy, comfortable operation of the BX53M also improves reproducibility by minimizing human error.

Simple Illuminator
Intuitive Microscope Controls
Find the Focus Quickly
Consistent Illumination
Easy and Ergonomic Operation
Easy Restore Microscope Settings
Basic Measurement Functions

Functional

The BX53M maintains the traditional contrast methods of conventional microscopy, such as brightfield, darkfield, polarized light, and differential interference contrast. As new materials are developed, many of the difficulties associated with detecting defects using standard contrast methods can be solved using advanced microscopy techniques for more accurate and reliable inspections. New illumination techniques and options for image acquisition within PRECiV image analysis software give users more choices of how to evaluate their samples and document findings.

The Invisible Becomes Visible
Create All-in-focus Images
Easily Move the Stage for Panorama
Capture Both Bright and Dark Areas
Adaptable to Suit Observational and Analysis Preferences
Accommodates a Wide Range of Samples

PRECiV

Leading-Edge Optics

Olympus’ history of developing high-quality optics has resulted in a record of proven optical quality and microscopes that offer excellent measurement accuracy.

Superior Optical Performance
Stable Color Temperature and High-Intensity White LED Illumination
Support Precise Measurement
Seamless Stitching

Wave Front Aberration Control

Bad wavefront

Good wavefront (UIS2 objective)

Highly Reliable Modular System Concept

Never in This Simplicity

General Use

Dedicated Use

Entry

Easy setup with basic features

Standard

Simple to use with versatile upgrades

Advanced

Supports numerous advanced features

Fluorescence

Ideally suited for Fluorescence observation

Infrared

Designed to use Infrared observation to inspect integrated circuits

Polarization

Designed for observing birefringence characteristics

LCD color filter (Transmitted/BF)

Microstructure with ferritic grains (Reflected/DF)

Microstructure with ferritic grains

(Reflected/DF)

Copper wire of coil

Copper wire of coil
（BF + DF/MIX）

Resist on IC pattern

Resist on IC pattern
（FL + DF/MIX）

Silicon layering IC pattern

Silicon layering IC pattern
（IR）

Asbestos

Asbestos
（POL）

Entry

Standard

Advanced

Fluorescence

Infrared

Polarization

	Entry	Standard	Advanced	Fluorescence	Infrared	Polarization
Microscope frame	Reflected or Reflected/Transmitted		Reflected or Reflected/Transmitted		Reflected	Transmitted
Standard	R-BF or T-BF	R-BF or T-BF or DF	R-BF or T-BF or DF or MIX	R-BF or T-BF or DF or FL	R-BF or IR	T-BF or POL
Option	DIC	DIC/MIX	DIC	DIC/MIX	－	－
Simple illuminator	－			－	－	－
Aperture legend	－				－
Coded hardware	－				－
Focus scale index
Light intensity manager				－	－
Hand switch operation					－	－
MIX observation					－	－
Objectives	Select from 3 objectives based on your applications		Select from 3 objectives based on your applications		Objectives for IR	Objectives for POL
Stage	Select from 5 stages based on the size of your samples		Select from 5 stages based on the size of your samples			Stage for POL

OBSERVATION METHOD

R-BF: Brightfield (Reflected)
T-BF: Brightfield (Reflected/Transmitted)
DF: Darkfield
DIC: Differential interference contrast / Simple polarization
MIX: MIX
FL: Fluorescence
IR: Infrared
POL: Polarization

*T-BF can be used when selecting Reflected/Transmitted microscope frame.

: Standard
: Option

Example Configurations for Materials Science

Modular design enables various configurations to meet users’ requirements.
Below you can find some examples of configuration for materials science.

BX53M Reflected and Reflected/Transmitted Light Combination

There are two types of microscope frames in the BX3M series, one for reflected light only and one for both reflected and transmitted light. Both frames can be configured with manual, coded, or motorized components. The frames are outfitted with ESD capability to protect electronic samples.

BX53MRF-S example configuration

BX53MTRF-S example configuration

BX53M IR Combination

IR objectives can be used for semiconductor inspection, measurement, and processing applications where imaging through silicon is required to see the pattern. 5X to 100X infrared (IR) objectives are available with chromatic aberration correction from visible light wavelengths through the near infrared. For high magnification work, rotating the correction collar of the LCPLNIR series of lenses corrects for aberrations caused by sample thickness. A clear image is obtained with a single objective.

BX53M IR Combination

BX53M Polarized Light Combination

The optics of the BX53M polarized light provide geologists with the right tools for high-contrast polarized light imaging. Applications such as mineral identification, investigating the optical characteristics of crystals, and observing solid rock sections benefit from system stability and precise optical alignment.

BX53-P orthoscopic configuration

BX53-P conoscopic/orthoscopic configuration

Bertrand Lens for Conoscopic and Orthoscopic Observations

With a U-CPA conoscopic observation attachment, switching between orthoscopic and conoscopic observation is simple and fast. It is focusable for clear back focal plane interference patterns. The Bertrand field stop makes it possible to obtain consistently sharp and clear conoscopic images.

Bertrand Lens

An Extensive Range of Compensator and Wave Plates

Six different compensators are available for measurements of birefringence in rock and mineral thin sections. Measurement retardation level ranges from 0 to 20λ. For easier measurement and high image contrast, the Berek and Senarmont compensators can be used, which change the retardation level in the entire field of view.

An Extensive Range of Compensator and Wave Plates

Measuring Range of Compensators

Compensator	Measuring Range	Major Application
Thick Berek (U-CTB)	0 to 11,000 nm (20 λ)	Measurement of High Retardation Level (R^*>3λ) (crystals, macromolecules, fiber, etc.)
Berek (U-CBE)	0 to 1,640 nm (3 λ)	Measurement of Retardation Level (crystals, macromolecules, living organisms, etc.)
Senarmont Compensator (U-CSE)	0 to 546 nm (1 λ)	Measurement of Retardation Level (crystals, living organisms, etc.) Enhancement of Image Contrast (living organisms, etc.)
Brace-Koehler Compensator 1/10λ (U-CBR1)	0 to 55 nm (1/10 λ)	Measurement of Low Retardation Level (living organisms, etc.) Enhancement of Image Contrast (living organisms, etc.)
Brace-Koehler Compensator 1/30λ (U-CBE2)	0 to 20 nm (1/30 λ)	Measurement of image contrast (living organisms, etc.)
Quartz Wedge (U-CWE2)	500 to 2,200 nm (4 λ)	Approximate Measurement of Retardation Level (crystal, macromolecules, etc.)

*R = retardation level
For more accurate measurement, it is recommended that compensators (except U-CWE2) be used together with the interference filter 45-IF546.

Strain Free Optics

Thanks to Olympus’ sophisticated design and manufacturing technology, the UPLFLN-P strainfree objectives reduce internal strain to the minimum. This means a higher EF value, resulting in excellent image contrast.

BXFM System

The BXFM can be adapted to special applications or integrated into other instruments. The modular construction provides for straightforward adaptation to unique environments and configurations with a variety of special small illuminators and fixturing mounts.

BXFM

Modular Design, Build Your System Your Way

Microscope Frames

There are two microscope frames for reflected light, one also has transmitted Light; capability. An adapter is available to raise the illuminator to accommodate taller samples.

		Reflected light	Transmitted light	Sample height
1	BX53MRF-S	■	－	0 to 65 mm
2	BX53MTRF-S	■	■	0 to 35 mm
1, 3	BX53MRF-S + BX3M-ARMAD	■	－	40 to 105 mm
2, 3	BX53MTRF-S + BX3M-ARMAD	■	■	40 to 75 mm

Convenient Accessories for Microscopy use

－	HP-2	Hand press
－	COVER-018	Dust cover

Stands

For microscopy applications where the sample will not fit on a stage, the illuminator and optics can be mounted to a larger stand or to another piece of equipment.

BXFM + BX53M Illuminator Configuration

1	BXFM-F	Frame interface is wall mounting 32 mm pillar
2	BX3M-ILH	Illuminator holder
3	BXFM-ILHSPU	Counter spring for BXFM
5	SZ-STL	Large stand

BXFM + U-KMAS Illuminator Configuration

1	BXFM-F	Frame interface is wall mounting 32 mm pillar
4	BXFM-ILHS	U-KMAS holder
5	SZ-STL	Large stand

Tubes

For microscope imaging with eyepieces or for camera observation, select tubes by imaging type and operator’s posture during observation.

		FN	Type	Angle type	Image	Number of diopter adjustment mechanisms
1	U-TR30-2	22	Trinocular	Fixing	Reverse	1
2	U-TR30IR	22	Trinocular for IR	Fixing	Reverse	1
3	U-ETR-4	22	Trinocular	Fixing	Erect	－
4	U-TTR-2	22	Trinocular	Tilting	Reverse	－
5	U-SWTR-3	26.5	Trinocular	Fixing	Reverse	－
6	U-SWETTR-5	26.5	Trinocular	Tilting	Erect	－
7	U-TLU	22	Single port	－	－	－
8	U-SWATLU	26.5	Single port	－	－	－

Illuminators

The illuminator projects light onto the sample based on the observation method selected. Software interfaces with coded illuminators to read the cube position and automatically recognize the observation method.

Coded function	Light source	BF	DF	DIC	POL	IR	FL	MIX	AS/FS
1	BX3M-RLAS-S	Fixed 3 cube position	LED - Built in	■	■	■	■	－	－	■	■
2	BX3M-URAS-S	Attachable 4 cube position	LED	■	■	■	■	－	－	■	■
			Halogen	■	■	■	■	■	－	■	■
			Mercury/Light guide	■	■	■	■	－	■	■	■
3	BX3M-RLA-S		LED	■	■	■	■	－	－	■	■
3	BX3M-RLA-S		Halogen	■	■	■	■	■	－	■	■
4

SPECIFICATIONS OF BX53M SUGGESTED CONFIGURATION FOR GENERAL USE

			Entry		Standard		Advanced
Optical system			UIS2 optical system (infinity-corrected)
Main unit	Microscope frame		BX53MRF-S (Reflected)	BX53MTRF-S (Reflected/Transmitted)	BX53MRF-S (Reflected)	BX53MTRF-S (Reflected/Transmitted)	BX53MRF-S (Reflected)	BX53MTRF-S (Reflected/Transmitted)
	Focus		Stroke: 25 mm Fine stroke per rotation: 100 μm Minimum graduation: 1 μm With upper limit stopper, torque adjustment for coarse handle
	Max. specimen height		Reflected: 65 mm (w/o spacer), 105 mm (with BX3M-ARMAD) Reflected/Transmitted: 35 mm (w/o spacer), 75 mm (with BX3M-ARMAD)
	Observation tube	Wide field (F.N.22)	U-TR30-2-2 Inverted: trinocular
	Illumination	Reflected light Transmitted light	BX3M-KMA-S White LED, BF/DIC/POL/MIX FS, AS (with centering mechanism), BF/DF interlocking		BX3M-RLAS-S Coded, White LED, BF/DF/DIC/POL/MIX FS, AS (with centering mechanism), BF/DF interlocking
			－	BX3M-LEDT White LED Abbe/long working distance condensers	－	BX3M-LEDT White LED Abbe/long working distance condensers	－	BX3M-LEDT White LED Abbe/long working distance condensers
	Revolving nosepiece		U-5RE-2 For BF: Quintuple		U-D6BDRE For BF/DF: Sextuple			U-D6BDRES-S For BF/DF : Sextuple, Coded
	Eyepiece（F.N.22)		WHN10 WHN10X-H
	MIX observation		－					BX3M-CB Control box BX3M-HS Hand switch U-MIXR-2 MIX slider for reflected light observation U-MIXRCBL Cable for MIXR
	Condenser (Long working distance)		－	U-LWCD	－	U-LWCD	－	U-LWCD
	Power cable		UYCP (x1)					UYCP (x2)
	Weight		Reflected: approx.15.8 kg (microscope frame 7.4 kg) Reflected/transmitted: approx. 18.3 kg (microscope frame 7.6 kg)
Objectives	MPLFLN set		MPLFLN5X, 10X, 20X, 50X, 100X BF/POL/FL observation		－
	MPLFLN BD set		－		MPLFLN5XBD, 10XBD, BD, 50XBD, 100XBD BF/DF/DIC/POL/FL observation
	MPLFLN-BD, LMPLFLN-BD set		－		MPLFLN5XBD, 10XBD, MPLFLN20XBD, 50XBD, 100XBD BF/DF/DIC/POL/FL observation
	MPLFLN-BD, MXPLFLN-BD, LMPLFLN-BD set		－		MPLFLN5XBD, 10XBD, MXPLFLN20XBD, 50XBD, LMPLFLN20XBD, 50XBD, 100XBD BF/DF/DIC/POL/FL observation
Stage (X x Y)	76 mm x 52 mm set		U-SVRM, U-MSSP Coaxial right handle stage / 76 (X) × 52 (Y) mm, with torque adjustment
	100 mm x 10 0mm set		U-SIC4R2, U-MSSP4 Large-size coaxial right handle stage / 100 (X) x 100 (Y) mm, with lock mechanism in Y axis
	100 mm x 100 (G) mm set		U-SIC4R2, U-MSSPG Large-size coaxial right handle stage / 100 (X) x 100 (Y) mm, with lock mechanism in Y axis (Glass plate)
	150 mm x 100 mm set		U-SIC64, U-SHG, U-SP64 Large-size coaxial right handle stage / 150 (X) x 100 (Y) mm, with torque adjustment, with lock mechanism in Y axis
	150 mm x 100 (G) mm set		U-SIC64, U-SHG, U-SPG64 Large-size coaxial right handle stage / 150 (X) x 100 (Y) mm, with torque adjustment, with lock mechanism in Y axis (Glass plate)
Option	MIX observation set*		BX3M-CB, BX3M-HS, U-MIXR-2, U-MIXRCBL				－
	DIC*		U-DICR
	Intermediate Tubes		U-CA, U-EPA2, U-TRU
	Filters		U-25ND6, U-25ND25, U-25LBD, U-25LBA, U-25Y48, U-AN360-3, U-AN360P, U-PO3, U-POTP3, U-25IF550, U-25L42, U-25, U-25FR
	Filter for condenser		43IF550-W45, U-POT
	Stage plate		U-WHP64, BH2-WHR43, BH2-WHR54, BH2-WHR65, U-WHP2
	Specimen holder		U-HRD-4, U-HLD-4, U-HRDT-4, U-HLDT-4
	Handle rubber		U-SHG, U-SHGT

_{*Cannot be used with U-5RE-2.}

BX53M / BXFM ESD UNITS

Items	Microscope frame	BX53MRF-S, BX53MTRF-S
	Illuminator	BX3M-KMA-S, BX3M-RLA-S, BX3M-URAS-S, BX3M-RLAS-S
	Nosepiece	U-D6BDREMC, U-D6BDRES-S, U-D6RE-ESD, U-D5BDREMC-ESD, U-5RES-ESD
	Stage	U-SIC4R2, U-MSSP4

SPECIFICATIONS OF BX53M SUGGESTED CONFIGURATION FOR DEDICATED USE

Fluorescence		Infrared	Polarized
Optical system				UIS2 optical system (infinity-corrected)
Main unit	Microscope frame			BX53MRF-S (Reflected)	BX53MTRF-S (Reflected/ Transmitted)	BX53MRF-S (Reflected)	BX53MTRF-S (Reflected/Transmitted)
	Focus			Stroke: 25 mm Fine stroke per rotation: 100 μm Minimum graduation: 1 μm With upper limit stopper, torque adjustment for coarse handle
	Max. specimen height			Reflected: 65 mm (w/o spacer), 105 mm (with BX3M-ARMAD) Reflected/Transmitted: 35 mm (w/o spacer), 75 mm (with BX3M-ARMAD)
	Observation tube	Wide field (F.N.22)		U-TR30-2 Inverted: trinocular		U-TR30IR Inverted: trinocular for IR	U-TR30-2 Inverted: trinocular
		Polarized Light Intermediate Attachment (U-CPA)	Bertrand Lens	－		－	Focusable
			Bertrand Field Stop	－		－	ø3.4 mm diameter (fixed)
			Engage or disengage Bertrand lens changeover between orthoscopic and conoscopic observation	－		－	Position of slider ● in Position of slider ○ out
			Analyzer Slot	－		－	Rotatable Analyzer with Slot (U-AN360P-2)
	Illumination	Reflected light	FL observation	BX3M-URAS-S Coded universal reflected light, 4 position mirror unit turret, (standard: U-FWUS, U-FWBS, U-FWGS, U-FBF etc) With FS, AS (with centering mechanism), With shutter mechanism		－	－
			IR observation	－		BX3M-RLA-S 100W halogen lamp for IR, BF/IR, AS (with centering mechanism) U-LH100IR (Including 12V 10W HAL-L) 100W Halogen light source for IR TH4-100 100W power supply TH4-HS Hand switch U-RMT Extension cord	－
		Transmitted light	POL observation	－		－	BX3M-LEDT White LED Abbe/long working distance condensers
	Revolving nosepiece			U-D6BDRES-S For BF/DF : Sextuple, Coded		U-5RE-2 For BF : Quintuple	U-P4RE Quadruple, centerable attachable components 1/4 wavelength retardation plate (U-TAD), tint plate (U-TP530) and various compensators can be attached using plate adapter (U-TAD)
	Eyepiece（F.N.22)			WHN10X
				WHN10X-H			CROSS-WHN10X
	Mirror units			U-FDF For DF U-FBFL For BF, built-in ND filter U-FBF For BF, detactable ND filter U-FWUS For Ultra Violet-FL U-FWBS For Blue-FL U-FWGS For Green-FL		－
	Filter / Polarizer / Analyzer			U-25FR Frost filter		U-BP1100IR/U-BP1200IR Band path filters for IR	43IF550-W45 Green filter
				U-POIR Reflected polarizer slider for IR		U-AN360IR Rotatable analyzer slider for IR	U-AN360P-2 360° Dial-rotatable Rotatable minimum angle 0.1°
	Condenser			U-LWCD Long working distance		－	U-POC-2 Achromat strain-free condenser. 360°rotatable polarizer with swing-out achromatic top-lens. Click stop at position "0°" is adjustable. NA 0.9 (top-lens in) / NA 0.18 (top-lens out) Aperture iris diaphragm: adjustable from 2 mm to 21 mm diameters
	Slider / Compensators			－			U-TAD Slider (Plate adapter)
							U-TP530 Tint plate U-TP137 1/4 wavelength retardation plate
	Power cable			UYCP (x1)		UYCP (x2)	UYCP (x1)
	Weight			Reflected: approx.15.8 kg (microscope frame 7.4 kg)	Reflected/transmitted: approx. 18.3 kg (microscope frame 7.6 kg)	Approx.18.9 kg (microscope frame 7.4 kg)	Approx.16.2 kg (microscope frame 7.6 kg)
Reflected FL light source	Light guide			U-LGPS, U-LLGAD, U-LLG150, Light guide set		－	－
	Mercury lamp			U-LH100HGAPO1-7, USH-103OL (x2), U-RFL-T, U-RCV Mercury lamp set		－	－
Objectives	MPLFLN set			MPLFLN5X, 10X, 20X, 50X, 100X BF/DIC/POL/FL observation		－	－
	MPLFLN BD set			MPLFLN5XBD, 10XBD, BD, 50XBD, 100XBD BF/DF/DIC/POL/FL observation		－	－
	MPLFLN-BD, LMPLFLN-BD set			MPLFLN5XBD, 10XBD, LMPLFLN20XBD, 50XBD, 100XBD BF/DF/DIC/POL/FL observation		－	－
	MPLFLN-BD, MXPLFLN-BD, LMPLFLN-BD set			MPLFLN5XBD, 10XBD, MXPLFLN20XBD, 50XBD, MPLFLN20XBD, 50XBD, 100XBD BF/DF/DIC/POL/FL observation		－	－
	IR set			－		LMPLN5XIR,10XIR, LCPLN20XIR,50XIR,100XIR IR observation	－
	POL set			－		－	UPLFLN4XP,10XP,20XP,40XP POL observation
Stage (X x Y)	76 mm x 52 mm set			U-SVRM, U-MSSP Coaxial right handle stage / 76 (X) × 52 (Y) mm, with torque adjustment
	100 mm x 10 0mm set			U-SIC4R2, U-MSSP4 Large-size coaxial right handle stage / 100 (X) x 100 (Y) mm, with lock mechanism in Y axis
	100 mm x 100 (G) mm set			U-SIC4R2, U-MSSPG Large-size coaxial right handle stage / 150 (X) x 100 (Y) mm, with lock mechanism in Y axis (Glass plate)
	150 mm x 100 mm set			U-SIC64, U-SHG, U-SP64 Large-size coaxial right handle stage / 150 (X) x 100 (Y) mm, with torque adjustment, with lock mechanism in Y axis
	150 mm x 100 (G) mm set			U-SIC64, U-SHG, U-SPG64 Large-size coaxial right handle stage / 150 (X) x 100 (Y) mm, with torque adjustment, with lock mechanism in Y axis (Glass plate)
	POL set			－			U-SRP+U-FMP Polarizing rotatable stage + Mechanical stage
Option	MIX observation set*			BX3M-CB, BX3M-HS, U-MIXR-2, U-MIXRCBL
	DIC*			U-DICR
	Intermediate Tubes			U-CA, U-EPA2, U-TRU
	Filters			U-25ND6, U-25ND25, U-25LBD, U-25LBA, U-25Y48, U-AN360-3, U-AN360P, U-PO3, U-POTP3, U-25IF550, U-25L42, U-25, U-25FR
	Filter for condenser			43IF550-W45, U-POT
	Stage plate			U-WHP64, BH2-WHR43, BH2-WHR54, BH2-WHR65, U-WHP2
	Specimen holder			U-HRD-4, U-HLD-4, U-HRDT-4, U-HLDT-4
	Handle rubber			U-SHG, U-SHGT

_{*Cannot be used with U-5RE-2}