Olympus BX53M Material Science Microscope
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Olympus BX53M Material Science Microscope

Designed with modularity in mind, the BX3M series provide versatility for a wide variety of materials science and industrial applications. With improved integration with PRECiV software, the BX53M provides a seamless workflow for standard microscopy and digital imaging users from observation to report creation.

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Overview Specifications

Advanced Microscopy Simplified

Designed with modularity in mind, the BX3M series provide versatility for a wide variety of materials science and industrial applications. With improved integration with PRECiV software, the BX53M provides a seamless workflow for standard microscopy and digital imaging users from observation to report creation.

BX53M

 

Choose the Best Model

Six BX53M suggested configuration provide you with flexibility to choose the features that you need.

  • For General use:  Entry, Standard, Advanced
  • For Dedicated use:  Fluorescence, Infrared, Polarization
  • Various configurations to meet users' requirements
  • Modular Design, Build Your System Your Way

Six BX53M suggested configuration

 

Comfortable and Easy to Use

The BX53M simplifies complex microscopy tasks through its well-designed and easy-to-use controls. Users can get the most out of the microscope without the need for extensive training. The easy, comfortable operation of the BX53M also improves reproducibility by minimizing human error.

  • Simple Illuminator
  • Intuitive Microscope Controls
  • Find the Focus Quickly
  • Consistent Illumination
  • Easy and Ergonomic Operation
  • Easy Restore Microscope Settings
  • Basic Measurement Functions

Functional

The BX53M maintains the traditional contrast methods of conventional microscopy, such as brightfield, darkfield, polarized light, and differential interference contrast. As new materials are developed, many of the difficulties associated with detecting defects using standard contrast methods can be solved using advanced microscopy techniques for more accurate and reliable inspections. New illumination techniques and options for image acquisition within PRECiV image analysis software give users more choices of how to evaluate their samples and document findings.

  • The Invisible Becomes Visible
  • Create All-in-focus Images
  • Easily Move the Stage for Panorama
  • Capture Both Bright and Dark Areas
  • Adaptable to Suit Observational and Analysis Preferences
  • Accommodates a Wide Range of Samples

PRECiV

 

Leading-Edge Optics

Olympus’ history of developing high-quality optics has resulted in a record of proven optical quality and microscopes that offer excellent measurement accuracy.

  • Superior Optical Performance
  • Stable Color Temperature and High-Intensity White LED Illumination
  • Support Precise Measurement
  • Seamless Stitching

Wave Front Aberration Control

Bad wavefront

Bad wavefront

Good wavefront (UIS2 objective)

Good wavefront (UIS2 objective)

 

Highly Reliable Modular System Concept

Never in This Simplicity

General Use Dedicated Use

 

 

Entry

Easy setup with basic features

Standard

Simple to use with versatile upgrades

Advanced

Supports numerous advanced features

Fluorescence

Ideally suited for Fluorescence observation

Infrared

Designed to use Infrared observation to inspect integrated circuits

Polarization

Designed for observing birefringence characteristics

LCD color filter (Transmitted/BF)

LCD color filter (Transmitted/BF)

Microstructure with ferritic grains (Reflected/DF)

Microstructure with ferritic grains

(Reflected/DF)

Copper wire of coil

Copper wire of coil
（BF + DF/MIX）

Resist on IC pattern

Resist on IC pattern
（FL + DF/MIX）

Silicon layering IC pattern

Silicon layering IC pattern
（IR）

Asbestos

Asbestos
（POL）

Entry

Standard

Advanced

Fluorescence

Infrared

Polarization

 

 

 Entry Standard Advanced Fluorescence Infrared Polarization
Microscope frame Reflected or Reflected/Transmitted Reflected or Reflected/Transmitted Reflected Transmitted
Standard R-BF or T-BF R-BF or T-BF or DF R-BF or T-BF or DF or MIX R-BF or T-BF or DF or FL R-BF or IR T-BF or POL
Option DIC DIC/MIX DIC DIC/MIX － －
Simple illuminator － － － －
Aperture legend － －
Coded hardware － －
Focus scale index
Light intensity manager － －
Hand switch operation － －
MIX observation     － －
Objectives Select from 3 objectives based on your applications Select from 3 objectives based on your applications Objectives for IR Objectives for POL
Stage Select from 5 stages based on the size of your samples Select from 5 stages based on the size of your samples Stage for POL

 

OBSERVATION METHOD

R-BF:  Brightfield (Reflected)
T-BF:  Brightfield (Reflected/Transmitted)
DF:  Darkfield
DIC:  Differential interference contrast / Simple polarization
MIX:  MIX
FL:  Fluorescence
IR:  Infrared
POL:  Polarization

*T-BF can be used when selecting Reflected/Transmitted microscope frame.

: Standard
: Option

 

Example Configurations for Materials Science

Modular design enables various configurations to meet users’ requirements.
Below you can find some examples of configuration for materials science.

 

BX53M Reflected and Reflected/Transmitted Light Combination

There are two types of microscope frames in the BX3M series, one for reflected light only and one for both reflected and transmitted light. Both frames can be configured with manual, coded, or motorized components. The frames are outfitted with ESD capability to protect electronic samples.

BX53MRF-S example configuration

BX53MRF-S example configuration

BX53MTRF-S example configuration

BX53MTRF-S example configuration

 

BX53M IR Combination

IR objectives can be used for semiconductor inspection, measurement, and processing applications where imaging through silicon is required to see the pattern. 5X to 100X infrared (IR) objectives are available with chromatic aberration correction from visible light wavelengths through the near infrared. For high magnification work, rotating the correction collar of the LCPLNIR series of lenses corrects for aberrations caused by sample thickness. A clear image is obtained with a single objective.

BX53M IR Combination

 

BX53M Polarized Light Combination

The optics of the BX53M polarized light provide geologists with the right tools for high-contrast polarized light imaging. Applications such as mineral identification, investigating the optical characteristics of crystals, and observing solid rock sections benefit from system stability and precise optical alignment.

BX53-P orthoscopic configuration

BX53-P orthoscopic configuration

BX53-P conoscopic/orthoscopic configuration

BX53-P conoscopic/orthoscopic configuration

 

Bertrand Lens for Conoscopic and Orthoscopic Observations

With a U-CPA conoscopic observation attachment, switching between orthoscopic and conoscopic observation is simple and fast. It is focusable for clear back focal plane interference patterns. The Bertrand field stop makes it possible to obtain consistently sharp and clear conoscopic images.

Bertrand Lens

 

An Extensive Range of Compensator and Wave Plates

Six different compensators are available for measurements of birefringence in rock and mineral thin sections. Measurement retardation level ranges from 0 to 20λ. For easier measurement and high image contrast, the Berek and Senarmont compensators can be used, which change the retardation level in the entire field of view.

An Extensive Range of Compensator and Wave Plates

 


 

Measuring Range of Compensators

Compensator Measuring Range Major Application
Thick Berek (U-CTB) 0 to 11,000 nm
(20 λ)		 Measurement of High Retardation Level (R*>3λ)
(crystals, macromolecules, fiber, etc.)
Berek (U-CBE) 0 to 1,640 nm
(3 λ)		 Measurement of Retardation Level
(crystals, macromolecules, living organisms, etc.)
Senarmont Compensator (U-CSE) 0 to 546 nm
(1 λ)		 Measurement of Retardation Level (crystals, living organisms, etc.)
Enhancement of Image Contrast (living organisms, etc.)
Brace-Koehler Compensator
1/10λ (U-CBR1)		 0 to 55 nm
(1/10 λ)		 Measurement of Low Retardation Level (living organisms, etc.)
Enhancement of Image Contrast (living organisms, etc.)
Brace-Koehler Compensator
1/30λ (U-CBE2)		 0 to 20 nm
(1/30 λ)		 Measurement of image contrast (living organisms, etc.)
Quartz Wedge (U-CWE2) 500 to 2,200 nm
(4 λ)		 Approximate Measurement of Retardation Level
(crystal, macromolecules, etc.)

*R = retardation level
For more accurate measurement, it is recommended that compensators (except U-CWE2) be used together with the interference filter 45-IF546.

 

Strain Free Optics

Thanks to Olympus’ sophisticated design and manufacturing technology, the UPLFLN-P strainfree objectives reduce internal strain to the minimum. This means a higher EF value, resulting in excellent image contrast.

 

BXFM System

The BXFM can be adapted to special applications or integrated into other instruments. The modular construction provides for straightforward adaptation to unique environments and configurations with a variety of special small illuminators and fixturing mounts.

BXFM

 

Modular Design, Build Your System Your Way

Microscope Frames

There are two microscope frames for reflected light, one also has transmitted Light; capability. An adapter is available to raise the illuminator to accommodate taller samples.

 

 

 Reflected light Transmitted light Sample height
1 BX53MRF-S ■ － 0 to 65 mm
2 BX53MTRF-S ■ ■ 0 to 35 mm
1, 3 BX53MRF-S + BX3M-ARMAD ■ － 40 to 105 mm
2, 3 BX53MTRF-S + BX3M-ARMAD ■ ■ 40 to 75 mm

Convenient Accessories for Microscopy use

－ HP-2 Hand press
－ COVER-018 Dust cover

Microscope Frames

 

Stands

For microscopy applications where the sample will not fit on a stage, the illuminator and optics can be mounted to a larger stand or to another piece of equipment.

BXFM + BX53M Illuminator Configuration

1 BXFM-F Frame interface is wall mounting 32 mm pillar
2 BX3M-ILH Illuminator holder
3 BXFM-ILHSPU Counter spring for BXFM
5 SZ-STL Large stand

BXFM + U-KMAS Illuminator Configuration

1 BXFM-F Frame interface is wall mounting 32 mm pillar
4 BXFM-ILHS U-KMAS holder
5 SZ-STL Large stand

Stands

 

Tubes

For microscope imaging with eyepieces or for camera observation, select tubes by imaging type and operator’s posture during observation.

 

 

 FN Type Angle type Image Number of diopter
adjustment mechanisms
1 U-TR30-2 22 Trinocular Fixing Reverse 1
2 U-TR30IR 22 Trinocular for IR Fixing Reverse 1
3 U-ETR-4 22 Trinocular Fixing Erect －
4 U-TTR-2 22 Trinocular Tilting Reverse －
5 U-SWTR-3 26.5 Trinocular Fixing Reverse －
6 U-SWETTR-5 26.5 Trinocular Tilting Erect －
7 U-TLU 22 Single port － － －
8 U-SWATLU 26.5 Single port － － －

Tubes

 

Illuminators

The illuminator projects light onto the sample based on the observation method selected. Software interfaces with coded illuminators to read the cube position and automatically recognize the observation method.

Coded function Light source BF DF DIC POL IR FL MIX AS/FS
1 BX3M-RLAS-S Fixed 3 cube position LED - Built in ■ ■ ■ ■ － － ■ ■
2 BX3M-URAS-S Attachable 4 cube position LED ■ ■ ■ ■ － － ■ ■
Halogen ■ ■ ■ ■ ■ － ■ ■
Mercury/Light guide ■ ■ ■ ■ － ■ ■ ■
3 BX3M-RLA-S

 

 LED ■ ■ ■ ■ － － ■ ■
Halogen ■ ■ ■ ■ ■ － ■ ■
4

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