NIKON S Plan Fluor ELWD ADM 40XC Objectives NA 0.6 WD 3.6-2.8mm_Tengrant Ltd.
+86-21-54286005 info@tenmed.net Room 602, Building 1, No. 111 Luxiang Road (Greenland Park Plaza), Baoshan District, Shanghai, China
Language: English

NIKON S Plan Fluor ELWD ADM 40XC Objectives NA 0.6 WD 3.6-2.8mm

NIKON S Plan Fluor ELWD ADM 40XC Objectives NA 0.6 WD 3.6-2.8mm

Phone:+86-21-54286005

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NIKON CFI S Plan Fluor ELWD ADM 40XC

Objectives NA 0.6 WD 3.6-2.8mm

CFI S Plan Fluor ELWD ADM 40XC

  CFI S Plan Fluor
ELWD ADM 40XC
  CFI S Plan Fluor ELWD ADM 40XC
Material Number MRH48430
Type Super Plan Fluor
Primary Technique Apodized Phase Contrast
Immersion Air
Magnification 40X
Numerical Aperture 0.6
Working Distance 3.6–2.8
Cover Glass Thickness 0–2
  CFI S Plan Fluor
ELWD ADM 40XC
Diagram
(mm)
Transmittance Graph
  CFI S Plan Fluor
ELWD ADM 40XC
Brightfield suitable
Darkfield universal condenser (dry) and darkfield ring, darkfield condenser (dry/oil)
DIC  
Fluorescence (visible) suitable
Fluorescence (UV) suitable
Fluorescence (NIR)  
Polarizing  
Polarizing Type  
Phase Contrast Ring ◎PH2
Phase Contrast Type ADM
  CFI S Plan Fluor
ELWD ADM 40XC
Correction Collar
Spring Loaded  
Iris  
Long Working Distance
Ti2-E PFS Compatible
  CFI S Plan Fluor
ELWD ADM 40XC
Asbestos  
Clear Tissue  
Clinical / Laboratory  
Confocal  
Education  
Laser Trapping / Tweezing  
Multiphoton  
SIM  
STORM  
Research
TIRF  
Tissue Culture

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