NIKON CFI Plan Fluor R-DS 40X Objectives NA 0.75 WD 0.66mm_Tengrant Ltd.
+86-21-54286005 info@tenmed.net Room 602, Building 1, No. 111 Luxiang Road (Greenland Park Plaza), Baoshan District, Shanghai, China
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NIKON CFI Plan Fluor R-DS 40X Objectives NA 0.75 WD 0.66mm

NIKON CFI Plan Fluor R-DS 40X Objectives NA 0.75 WD 0.66mm

Phone:+86-21-54286005

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NIKON CFI Plan Fluor R-DS 40X

Objectives NA 0.75 WD 0.66mm

Dispersion staining (DS) microscopy refers to a family of analytical optical staining methods used to help determine the identity of unknown microscopic materials. The dispersive properties of the unknown material can be probed when immersed in a material with known dispersion curve. Color (wavelength) is then used as readout of differences in dispersive properties. DS microscopy is commonly applied in testing for the presence of asbestos in construction materials.

Nikon offers phase-type DS (R-DS) objectives to meet customer needs. R-DS phase contrast objectives for dispersion staining use a phase plate to block the waveband where the refractive indices of two materials are similar.

CFI Plan Fluor R-DS 40X

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