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Leica DM1750M Materials Analysis Microscope

The new Leica DM1750 M is a material microscope designed for rapid, accurate analysis results even for a use in rough ambient conditions.

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DM1750M_Brochure_CN
DM1750M_Brochure-EN

With a focus on tasks in the material lab or research

The new Leica DM1750 M is a material microscope designed for rapid, accurate analysis results even for a use in rough ambient conditions.

Working with the Leica DM1750 M you will see, how simple and reliable microscopy can be. Its robust design contains an excellent optical system and allows the inspection even of larger samples, in brightfield, oblique- or with polarized light. The entire reflected light illumination is carried out with Power-LEDs which allow an inspection with different illumination angles, especially suitable for the detection of micro scratches or for gaining height information.

DM1750 M

 

Perfect light

LED illumination together with the built-in adjustable aperture diaphragm for reflected light provides cool, white light with an average lifetime of over 20 years saving cost in replacement lamps.

Perfect light

 

Precision magnification change

6- or 7-position nosepiece for fast and easy change of objective magnification allow the inspection of samples with up to 80mm in height. The highly accurate machining of the nosepieces ensures parcentration of all objectives in use.

Precision magnification change

 

See more with oblique light

For an oblique illumination of your samples the ergonomically positioned membrane-keyboard allows easy, intuitive operation of all 4 LED segments of the beam path.

See more with oblique light

 

Ultra hard ceramic surfaces

The surface of our industrial stages incorporates a new ceramic material with a hardness that has never been attained before. It was specially developed for the demands of heavy-duty industrial use over many years, saving you time and money.

载物台

 

LEICA DM1750M

Stand Robust material inspection microscope stand
Reflected light axis LED 4 segment illumination for oblique investigations
– LED-lifetime 20+ years
– Contrasting modes: Brightfield,
Differential Interference Contrast, Polarization
– Built-in adjustable aperture diaphragm
– POL observation using polarizer/analyzer
Focusing – 2-gear focusing (coarse/fine with 1 μm micrometer scalewith top focus stop) or
– 3-gear focusing (coarse) (focus stop), (medium),fine with 1 and 4 μm micrometer scales,
– Torque adjustment, sample protection stop,height adjustable focus knobs
Tubes – Binocular tube 30° or 45° w/wo integrated eyepieces
– Trinocular camera tube 30° or 45° w/wo integrated eyepieces
– Upright image binocular/trinocular tube
– 10x/20 FOV fixed eyepieces, 10x/20 FOV focusing eyepieces, 10x/22 FOV focusing eyepieces
Objective turret/objectives 6x BF M25 and 7x BF M25 objective turret
HI PLAN EPI objectives 5x, 10x, 20x
N PLAN EPI objectives 2.5x–100x
PLAN Fluotar objectives 1.25x–100x
Accessories Fixed ergonomic stage (76 x 50 mm), left and right-hand
operation or rotatable stage (76 x 50 mm) with wear-resistant
ceramic surface or IL stage for large samples (up to 80 mm in
height)

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